6372.2:
Trimming of nano grain thick-film pastes by voltage pulses
Abstract
The aim of this project is to study how high voltage pulses affect the ca. 1 nm wide metal / insulator / metal tunneling junctions in thick-film resistors, with the goal of using this effect as a sensor trimming procedure, potentially enabling lower cost, faster and more flexible trimming compared to the well established laser trimming, as well as improved post-trim stability. We intend to study resistor pastes developed during the TopNano 21 project 5557.2. They will be used to determine precisely the influence of the nano-scale microstructural parameters (interparticle distance, number of particles, composition of the interparticle dielectric film), which influence the voltage trimming characteristics.