6351.1:
Fourier transformed atomic force microscopy for the rapid determination of surface properties with nanometer resolution.
Abstract
Surface properties like elasticity, wettability, and adhesion determine the interaction force between tip and sample in atomic force microscopy (AFM). This force is encoded in the frequency response of the signal of dynamic intermittent contact AFM. The feasibility of inverting the signal in dynamic AFM for the rapid determination of surface properties with high spatial resolution in liquid and ambient environment shall be investigated.