4923.1:
Carbon nanotube tips for novel, high-resolution near-field optical microscope probes
Abstract
Scanning probe microscopy, or SPM, has since its invention in 1981 established itself as one of the major experimental techniques in physics and material science. The scanning probe microscope is an imaging tool with a vast dynamic range, spanning the realms between the optical and high-resolution electron microscopes. Given the right probe, SPM can measure physical properties like topography, magnetic fields, elastic moduli and luminescence with a lateral resolution of a few tens of nanometers.
The goal of this project is to explore the use of carbon nanotubes as high resolution probes in SPM, and more specifically in Scanning Near Field Optical Microscopy, or SNOM.