4786.2:
Nanometer-scale analysis of magnetic materials, hard disc components and current distributions in semiconductor devices using quantitative magnetic force microscopy
Abstract
Recently developed methods for magnetic force microscopy (MFM) calibration [1,2] allow the determination of the stray field of the MFM tip with a resolution of 50 nm. Using calibrated tips, it is possible to perform quantitative MFM (QMFM) measurements of the field of different samples. Besides this, it is possible to locally apply a known field to a sample in an area with a radius of approximately 100 nm. The aim of the project is to implement QMFM into an existing commercial scanning force microscopy system (Nanolyser from Triple–O Microscopy GmbH) for the use of characterization, quality control and failure analysis of magnetic recording devices. Such a system can be used for measurements both magnetic hard discs and read/write heads. Furthermore, the application of QMFM to the testing of current distributions in semiconductor devices will be investigated.