4688.1:
Magnetic Supertips for Scanning Probe Microscopes
Abstract
The tip, as the most delicate part in scanning probe microscopy, is tailored to the application by focused electron beam induced deposition (EBID) of materials. We want to deposit nanocrystals of different sizes (2 – 20 nm in diameter) of magnetic elements (Ni, Co, Fe) on the apex of scanning probe tips. The final radius of the conical tip will be determined by the size of the nanocrystals and whether an embedding matrix appears or not. Alternatively we will try to deposit extremely high aspect ratio (bottom diameter 150nm, length 2 µm) tips of magnetic materials. These tips will be used for studying the magnetic properties of magnetic data storage devices.