5919.1:
Characterization and optimization of batch-produced microfabricated near-field optical probes
Abstract
The objectives of this project are twofold: First we want to accurately describe the propagation and scattering of electromagnetic fields in scanning near-field optical microscopy (SNOM) probes, with an emphasis on fully aluminum-coated micromachined cantilever probe tips. The dependence of the light throughput and the near-field distribution on different geometrical parameters such as taper angle, metal thickness and roughness, apex shape, illumination polarization, etc…, shall be investigated in detail. Second, this detailed understanding of the relationship between the tip geometry and its field distribution will be used to design efficient quantitative characterization techniques of the near-field performances from data recorded in the far-field. These characterization techniques will make possible an efficient screening of batch-produced tips. Our approach will be based on two complementary techniques to solve Maxwell's equations, so that both the spectral and the dynamic responses of the system can be investigated.