5101.1:
High Resolution Probes for Scanning Near-Field Optical Microscopy (SNOM) by controlled Electro-Chemical Preparation
Abstract
A high resolution scanning near-field optical microscope (SNOM) suitable for routine operation shall be developed. The microscope is distinguished from previous developments by a new method of aperture SNOM probe (ASP) preparation and repair: The required sub-100 nanometer-size aperture at the probe apex will be generated by electrolytic dissolution or deposition of metal. This will be done in situ, i.e. while the ASP is mounted in the SNOM. This holds promise for highly simplified operation since aperture damage during storage and mounting can be avoided and – an absolute novelty –worn out ASPs can be repaired without removal from the SNOM.
Note: The aspects of in situ repair and integration into the SNOM were conceived after submission of the preproposal. They are considered a significant improvement of the original concept and therefore integrated here.